ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...
InhaltsangabeDedication.- Preface.- Foreword.- Acknowledgments.- 1. Introduction.- 2. Functional ...
InhaltsangabeIntroduction.- Power, Junction Temperature, and Reliability.- Burn-in as a Reliabili...
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Function...
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...
InhaltsangabePower, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Te...
InhaltsangabeForeword. Preface. Acronyms. 1. INTRODUCTION AND MOTIVATION. 1.1 Motivation. 1.2 SRA...
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologi...